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On N-Detect Pattern Set Optimization
San Jose, California March 27-March 29
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2006.947th International Symposium on Qualit ...
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Yu Huang, Mentor Graphics Corporation,
In this paper, we illustrate that the traditional Ndetect ATPG is unoptimized in terms of the size of the generated pattern set. The optimization problem is formulated as a minimum covering problem. Integer Linear Programming (ILP) is applied to obtain an Ndetection ATPG pattern set with the minimum number of patterns. A heuristic method is also proposed to obtain sub-optimal solutions efficiently. Experimental results demonstrate that by using the proposed method, the number of N-detection patterns can be reduced by about 18% for N=3 and about 13% for N=5 without compromising N-detection objective.
Citation:
Yu Huang, "On N-Detect Pattern Set Optimization," isqed, pp.445-450, 7th International Symposium on Quality Electronic Design (ISQED'06), 2006
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