Gerhard Knoblinger, James W. Tschanz, Marcal Pol,
"SUB-45nm Technology and Design Challenges,"
Quality Electronic Design, International Symposium on, pp. 3, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.
BibTex
x
@article{
10.1109/ISQED.2007.153, author = {Gerhard Knoblinger and James W. Tschanz and Marcal Pol}, title = {SUB-45nm Technology and Design Challenges}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2795-7}, pages = {3}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.153}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Quality Electronic Design, International Symposium on TI - SUB-45nm Technology and Design Challenges SN - 0-7695-2795-7 SP EP A1 - Gerhard Knoblinger, A1 - James W. Tschanz, A1 - Marcal Pol, PY - 2007 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -
Gerhard Knoblinger, James W. Tschanz, Marcal Pol, "SUB-45nm Technology and Design Challenges," isqed, pp.3, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007
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