Cross Layer Error Exploitation for Aggressive Voltage Scaling

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http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.53

8th International Symposium on Qualit ...

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	ASCII Text	x
	Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj, "Cross Layer Error Exploitation for Aggressive Voltage Scaling," Quality Electronic Design, International Symposium on, pp. 192-197, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.

	BibTex	x
	@article{ 10.1109/ISQED.2007.53, author = {Amin Khajeh Djahromi and Ahmed M. Eltawil and Fadi J. Kurdahi and Rouwaida Kanj}, title = {Cross Layer Error Exploitation for Aggressive Voltage Scaling}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2795-7}, pages = {192-197}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.53}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Cross Layer Error Exploitation for Aggressive Voltage Scaling SN - 0-7695-2795-7 SP192 EP197 A1 - Amin Khajeh Djahromi, A1 - Ahmed M. Eltawil, A1 - Fadi J. Kurdahi, A1 - Rouwaida Kanj, PY - 2007 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Amin Khajeh Djahromi, UC Irvine, USA

Ahmed M. Eltawil, UC Irvine, USA

Fadi J. Kurdahi, UC Irvine, USA

Rouwaida Kanj, IBM Austin Research Labs, USA

This paper shows that by co-designing circuits and systems, considerable power savings are possible if the inherent data redundancy of candidate systems such as wireless is used to compensate for hardware failures. A comprehensive study of 6T SRAM failure modes is presented. The generated statistics are used to quantify a power savings of up to 17.5% for a case study of a 32 nm CMOS 3GPP WCDMA modem.

Citation:

Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj, "Cross Layer Error Exploitation for Aggressive Voltage Scaling," isqed, pp.192-197, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007

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