Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's

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http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.80

8th International Symposium on Qualit ...

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	Daniela De Venuto, Leonardo Reyneri, "Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's," Quality Electronic Design, International Symposium on, pp. 519-526, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007.

	BibTex	x
	@article{ 10.1109/ISQED.2007.80, author = {Daniela De Venuto and Leonardo Reyneri}, title = {Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2007}, isbn = {0-7695-2795-7}, pages = {519-526}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.80}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's SN - 0-7695-2795-7 SP519 EP526 A1 - Daniela De Venuto, A1 - Leonardo Reyneri, PY - 2007 KW - null VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Daniela De Venuto, Politecnico di Bari, Italy

Leonardo Reyneri, Politecnico di Torino, Italy

This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution \Sigma \Delta ADC?s. Simulation results showed a detection sensitivity on specifications parameters of up to -100dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.

Citation:

Daniela De Venuto, Leonardo Reyneri, "Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's," isqed, pp.519-526, 8th International Symposium on Quality Electronic Design (ISQED'07), 2007

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