Variation Aware Spline Center and Range Modeling for Analog Circuit Performance

March 17-March 19

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.118

9th International Symposium on Qualit ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Shubhankar Basu Articles by Balaji Kommineni Articles by Ranga Vemuri

	ASCII Text	x
	Shubhankar Basu, Balaji Kommineni, Ranga Vemuri, "Variation Aware Spline Center and Range Modeling for Analog Circuit Performance," Quality Electronic Design, International Symposium on, pp. 162-167, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

	BibTex	x
	@article{ 10.1109/ISQED.2008.118, author = {Shubhankar Basu and Balaji Kommineni and Ranga Vemuri}, title = {Variation Aware Spline Center and Range Modeling for Analog Circuit Performance}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3117-5}, pages = {162-167}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.118}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Variation Aware Spline Center and Range Modeling for Analog Circuit Performance SN - 978-0-7695-3117-5 SP162 EP167 A1 - Shubhankar Basu, A1 - Balaji Kommineni, A1 - Ranga Vemuri, PY - 2008 KW - Spline KW - Process Variation KW - Analog KW - Center and Range VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Shubhankar Basu

Balaji Kommineni

Ranga Vemuri

With scaling technologies, process variations have increased significantly. This has led to deviations in analog performance from their expected values. Performance macromodeling aids in reduction of synthesis time by removing the simulation overhead. In this work, we develop a novel Spline based Center and Range Method (SCRM) for process Variation Aware Performance MACromodeling (VAPMAC) which works on interval valued data. Experiments demonstrate around 200K times computational time advantage using VAPMAC generated macromodels over SPICE monte carlo simulation. The results also demonstrate less than 10% loss in accuracy in computing the performance bounds using the macromodels compared to the spice simulations.

Index Terms:

Spline, Process Variation, Analog, Center and Range

Citation:

Shubhankar Basu, Balaji Kommineni, Ranga Vemuri, "Variation Aware Spline Center and Range Modeling for Analog Circuit Performance," isqed, pp.162-167, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.