An Approach for a Comprehensive QA Methodology for the PDKs

March 17-March 19

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http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.124

9th International Symposium on Qualit ...

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	ASCII Text	x
	Sridhar Joshi, Ravi Perumal, Kamesh Gadepally, Mark Young, "An Approach for a Comprehensive QA Methodology for the PDKs," Quality Electronic Design, International Symposium on, pp. 480-483, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008.

	BibTex	x
	@article{ 10.1109/ISQED.2008.124, author = {Sridhar Joshi and Ravi Perumal and Kamesh Gadepally and Mark Young}, title = {An Approach for a Comprehensive QA Methodology for the PDKs}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3117-5}, pages = {480-483}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.124}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - An Approach for a Comprehensive QA Methodology for the PDKs SN - 978-0-7695-3117-5 SP480 EP483 A1 - Sridhar Joshi, A1 - Ravi Perumal, A1 - Kamesh Gadepally, A1 - Mark Young, PY - 2008 KW - PDK KW - Quality KW - Test structures KW - Regression KW - categorization KW - Bugs KW - Matrix VL - 0 JA - Quality Electronic Design, International Symposium on ER -

Achieving First time Silicon is a necessity to meet the Organization’s bottom line. From the CAD perspective, ensuring quality in the collateral that is supplied to the designers plays a very crucial role in this objective. This paper attempts to capture the evolution of process of achieving high quality Process Design Kits (PDKs).

Index Terms:

PDK, Quality, Test structures, Regression, categorization, Bugs, Matrix

Citation:

Sridhar Joshi, Ravi Perumal, Kamesh Gadepally, Mark Young, "An Approach for a Comprehensive QA Methodology for the PDKs," isqed, pp.480-483, 9th International Symposium on Quality Electronic Design (isqed 2008), 2008

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