"Technical Program Committee,"
Test Conference, International, pp. 4, International Test Conference 2000 (ITC'00), 2000.
BibTex
x
@article{
10.1109/ITC.2000.10045, author = {}, title = {Technical Program Committee}, journal ={Test Conference, International}, volume = {0}, year = {2000}, issn = {1089-3539}, pages = {4}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2000.10045}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Test Conference, International TI - Technical Program Committee SN - 1089-3539 SP EP PY - 2000 KW - null VL - 0 JA - Test Conference, International ER -
Citation:
"Technical Program Committee," itc, pp.4, International Test Conference 2000 (ITC'00), 2000
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