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TEST PROGRAMMING ENVIRONMENT IN A MODULAR, OPEN ARCHITECTURE TEST SYSTEM
Charlotte, NC, USA October 26-October 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.175International Test Conference 2004 (I ...
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Ankan Pramanick, Ramachandran Krishnaswamy, Mark Elston, Toshiaki Adachi, Harsanjeet Singh, Bruce Parnas, "TEST PROGRAMMING ENVIRONMENT IN A MODULAR, OPEN ARCHITECTURE TEST SYSTEM," Test Conference, International, pp. 413-422, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.175,
author = {Ankan Pramanick and Ramachandran Krishnaswamy and Mark Elston and Toshiaki Adachi and Harsanjeet Singh and Bruce Parnas},
title = {TEST PROGRAMMING ENVIRONMENT IN A MODULAR, OPEN ARCHITECTURE TEST SYSTEM},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {413-422},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.175},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Test Conference, International
TI - TEST PROGRAMMING ENVIRONMENT IN A MODULAR, OPEN ARCHITECTURE TEST SYSTEM
SN - 1089-3539
SP413
EP422
A1 - Ankan Pramanick,
A1 - Ramachandran Krishnaswamy,
A1 - Mark Elston,
A1 - Toshiaki Adachi,
A1 - Harsanjeet Singh,
A1 - Bruce Parnas,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Ankan Pramanick, Advantest America R&D Center Inc., Santa Clara, CA
Ramachandran Krishnaswamy, Advantest America R&D Center Inc., Santa Clara, CA
Mark Elston, Advantest America R&D Center Inc., Santa Clara, CA
Toshiaki Adachi, Advantest America R&D Center Inc., Santa Clara, CA
Harsanjeet Singh, Advantest America R&D Center Inc., Santa Clara, CA
Bruce Parnas, Advantest America R&D Center Inc., Santa Clara, CA
This paper addresses two key concepts in device test program development: test class programming and pattern management. These are explored in the context of an open architecture test system, where the primary requirement is the flexibility to integrate externally developed capabilities into the system. Development against an open architecture test system includes the integration of software-based solutions (such as user-developed test classes) and third party hardware modules, including the software necessary to support the modules. This paper focuses on the open architecture facets of test programming and pattern management, as embodied in the OPENSTAR^TM1 specification. The software for Advantest Corporation?s T2000 system is used as a concrete example for highlighting these concepts.
Citation:
Ankan Pramanick, Ramachandran Krishnaswamy, Mark Elston, Toshiaki Adachi, Harsanjeet Singh, Bruce Parnas, "TEST PROGRAMMING ENVIRONMENT IN A MODULAR, OPEN ARCHITECTURE TEST SYSTEM," itc, pp.413-422, International Test Conference 2004 (ITC'04), 2004
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