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Trends in Testing Integrated Circuits
Charlotte, NC, USA October 26-October 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.196International Test Conference 2004 (I ...
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Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge, "Trends in Testing Integrated Circuits," Test Conference, International, pp. 688-697, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/ITC.2004.196,
author = {Bart Vermeulen and Camelia Hora and Bram Kruseman and Erik Jan Marinissen and Robert Van Rijsinge},
title = {Trends in Testing Integrated Circuits},
journal ={Test Conference, International},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {688-697},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.196},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Test Conference, International
TI - Trends in Testing Integrated Circuits
SN - 1089-3539
SP688
EP697
A1 - Bart Vermeulen,
A1 - Camelia Hora,
A1 - Bram Kruseman,
A1 - Erik Jan Marinissen,
A1 - Robert Van Rijsinge,
PY - 2004
KW - null
VL - 0
JA - Test Conference, International
ER -
 
Bart Vermeulen, Philips Research Laboratories, Netherlands
Camelia Hora, Philips Research Laboratories, Netherlands
Bram Kruseman, Philips Research Laboratories, Netherlands
Erik Jan Marinissen, Philips Research Laboratories, Netherlands
Robert Van Rijsinge, Philips Semiconductors - ATO, Nijmegen, Netherlands
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
Citation:
Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge, "Trends in Testing Integrated Circuits," itc, pp.688-697, International Test Conference 2004 (ITC'04), 2004
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