A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems

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http://doi.ieeecomputersociety.org/10.1109/ITC.2004.21

International Test Conference 2004 (I ...

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	Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Krawinkel Christian, Katsuaki Ohsawa, Masao Sugai, "A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems," Test Conference, International, pp. 77-84, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.21, author = {Takahiro J. Yamaguchi and Masahiro Ishida and Kiyotaka Ichiyama and Mani Soma and Krawinkel Christian and Katsuaki Ohsawa and Masao Sugai}, title = {A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {77-84}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.21}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems SN - 1089-3539 SP77 EP84 A1 - Takahiro J. Yamaguchi, A1 - Masahiro Ishida, A1 - Kiyotaka Ichiyama, A1 - Mani Soma, A1 - Krawinkel Christian, A1 - Katsuaki Ohsawa, A1 - Masao Sugai, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Takahiro J. Yamaguchi, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan

Masahiro Ishida, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan

Kiyotaka Ichiyama, Advantest Laboratories, Ltd., Sendai, Miyagi, Japan

Mani Soma, University of Washington, Seattle, WA

Krawinkel Christian, Advantest Corporation, Gunma, Japan

Katsuaki Ohsawa, Advantest Corporation, Gunma, Japan

Masao Sugai, Advantest Corporation, Gunma, Japan

This paper presents the design and performance results of a real-time jitter measurement board for testing high-frequency clocks and data transceivers. The board targets high-volume manufacturing test to measure sinusoidal jitter tolerance and random jitter in computer and communication systems, with a substantial reduction in test cost compared to existing equipment.

Citation:

Takahiro J. Yamaguchi, Masahiro Ishida, Kiyotaka Ichiyama, Mani Soma, Krawinkel Christian, Katsuaki Ohsawa, Masao Sugai, "A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems," itc, pp.77-84, International Test Conference 2004 (ITC'04), 2004

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