An Economic Analysis and ROI Model for Nanometer Test

Charlotte, NC, USA October 26-October 28

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http://doi.ieeecomputersociety.org/10.1109/ITC.2004.29

International Test Conference 2004 (I ...

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	ASCII Text	x
	Brion Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane, "An Economic Analysis and ROI Model for Nanometer Test," Test Conference, International, pp. 518-524, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.29, author = {Brion Keller and Mick Tegethoff and Thomas Bartenstein and Vivek Chickermane}, title = {An Economic Analysis and ROI Model for Nanometer Test}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {518-524}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.29}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - An Economic Analysis and ROI Model for Nanometer Test SN - 1089-3539 SP518 EP524 A1 - Brion Keller, A1 - Mick Tegethoff, A1 - Thomas Bartenstein, A1 - Vivek Chickermane, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Brion Keller, Cadence Design Systems, Inc Endicott, NY

Mick Tegethoff, Cadence Design Systems, Inc Endicott, NY

Thomas Bartenstein, Cadence Design Systems, Inc Endicott, NY

Vivek Chickermane, Cadence Design Systems, Inc Endicott, NY

This paper describes an Economic and Return-on- Investment (RoI) model for a test methodology that ensures product quality for logic devices that are in the 130 nm technology node and below. We describe the key components of the nanometer test methodology (NTM) and how it drives the model. In addition to ensuring product quality we address the cost of test and time to volume and how both factors can be improved. Examples from realistic scenarios are provided to illustrate the net savings from the proposed NTM using this model.

Citation:

Brion Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane, "An Economic Analysis and ROI Model for Nanometer Test," itc, pp.518-524, International Test Conference 2004 (ITC'04), 2004

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