AN SRAM WEAK CELL FAULT MODEL AND A DFT TECHNIQUE WITH A PROGRAMMABLE DETECTION THRESHOLD

Charlotte, NC, USA October 26-October 28

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http://doi.ieeecomputersociety.org/10.1109/ITC.2004.32

International Test Conference 2004 (I ...

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	Andrei Pavlov, Manoj Sachdev, Jose Pineda de Gyvez, "AN SRAM WEAK CELL FAULT MODEL AND A DFT TECHNIQUE WITH A PROGRAMMABLE DETECTION THRESHOLD," Test Conference, International, pp. 1006-1015, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.32, author = {Andrei Pavlov and Manoj Sachdev and Jose Pineda de Gyvez}, title = {AN SRAM WEAK CELL FAULT MODEL AND A DFT TECHNIQUE WITH A PROGRAMMABLE DETECTION THRESHOLD}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {1006-1015}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.32}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - AN SRAM WEAK CELL FAULT MODEL AND A DFT TECHNIQUE WITH A PROGRAMMABLE DETECTION THRESHOLD SN - 1089-3539 SP1006 EP1015 A1 - Andrei Pavlov, A1 - Manoj Sachdev, A1 - Jose Pineda de Gyvez, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Andrei Pavlov, University of Waterloo, Waterloo, ON, Canada

Manoj Sachdev, University of Waterloo, Waterloo, ON, Canada

Jose Pineda de Gyvez, Philips Research Labs, Eindhoven, Netherlands

SRAM cell stability has become an important design and test issue owing to significant process spreads, non-ideal operational conditions, and subtle manufacturing defects in scaled-down geometries. In this article, we carry out an extensive SRAM SNM sensitivity analysis and propose an SRAM cell stability fault model for weak cell detection. This fault model is used to design and verify a proposed digitally programmable design-for-test (DFT) technique targeting the weak cell detection in embedded SRAMs (eSRAM).

Citation:

Andrei Pavlov, Manoj Sachdev, Jose Pineda de Gyvez, "AN SRAM WEAK CELL FAULT MODEL AND A DFT TECHNIQUE WITH A PROGRAMMABLE DETECTION THRESHOLD," itc, pp.1006-1015, International Test Conference 2004 (ITC'04), 2004

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