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ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test
Charlotte, NC, USA October 26-October 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.37International Test Conference 2004 (I ...
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Manu Rehani, LSI Logic Corporation
David Abercrombie, LSI Logic Corporation
Robert Madge, LSI Logic Corporation
Jim Teisher, LSI Logic Corporation
Jason Saw, Invantest Corporation, San Jose, CA, USA
ATE customers are increasingly viewing a tester that does not facilitate easy and consistent access to the test data as a barrier to their profitability. The data is needed towards various ends like, Statistical Post Processing (SPP) for Die Binning, Reliability improvement, Burn-in Elimination [16], Process/Yield Improvement, Adaptive Control, Product Characterization, Test Floor Statistical Process Control (SPC), Calibration & Test Repeatability [10] to name a few. Subcontractor & Foundry manufacturing have only increased the complexity of the task. The main premise of this paper is that: "Taking the measurement" is the ATE vendor?s expertise, "Evaluating the measurement" is the customer?s expertise and we have a proposal to clear the confusion and maximize the ROI of test. The paper discusses the current "state-of-theart" in terms of data collection, illustrates the windfall of benefits reaped from utilizing the ATE data and presents a proposal on how to improve the situation.
Citation:
Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw, "ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test," itc, pp.181-189, International Test Conference 2004 (ITC'04), 2004
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