FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS

Charlotte, NC, USA October 26-October 28

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http://doi.ieeecomputersociety.org/10.1109/ITC.2004.76

International Test Conference 2004 (I ...

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	Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski, "FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS," Test Conference, International, pp. 498-507, International Test Conference 2004 (ITC'04), 2004.

	BibTex	x
	@article{ 10.1109/ITC.2004.76, author = {Grzegorz Mrugalski and Chen Wang and Artur Pogiel and Jerzy Tyszer and Janusz Rajski}, title = {FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS}, journal ={Test Conference, International}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {498-507}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.76}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS SN - 1089-3539 SP498 EP507 A1 - Grzegorz Mrugalski, A1 - Chen Wang, A1 - Artur Pogiel, A1 - Jerzy Tyszer, A1 - Janusz Rajski, PY - 2004 KW - null VL - 0 JA - Test Conference, International ER -

Grzegorz Mrugalski, Mentor Graphics Corporation, Wilsonville, OR

Chen Wang, Mentor Graphics Corporation, Wilsonville, OR

Artur Pogiel, Poznan University of Technology, Poland

Jerzy Tyszer, Poznan University of Technology, Poland

Janusz Rajski, Mentor Graphics Corporation, Wilsonville, OR

The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. The proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction.

Citation:

Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski, "FAULT DIAGNOSIS IN DESIGNSWITH CONVOLUTIONAL COMPACTORS," itc, pp.498-507, International Test Conference 2004 (ITC'04), 2004

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