A Layered Adaptive Verification Platform for Simulation, Test, and Emulation

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http://doi.ieeecomputersociety.org/10.1109/MDT.2004.73

November/December 2004 (vol. 21 no. 6) pp. 464-471

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	Martin Zambaldi, Wolfgang Ecker, Renate Henftling, Matthias Bauer, "A Layered Adaptive Verification Platform for Simulation, Test, and Emulation," IEEE Design and Test of Computers, vol. 21, no. 6, pp. 464-471, November/December, 2004.

	BibTex	x
	@article{ 10.1109/MDT.2004.73, author = {Martin Zambaldi and Wolfgang Ecker and Renate Henftling and Matthias Bauer}, title = {A Layered Adaptive Verification Platform for Simulation, Test, and Emulation}, journal ={IEEE Design and Test of Computers}, volume = {21}, number = {6}, issn = {0740-7475}, year = {2004}, pages = {464-471}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.73}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - A Layered Adaptive Verification Platform for Simulation, Test, and Emulation IS - 6 SN - 0740-7475 SP464 EP471 EPD - 464-471 A1 - Martin Zambaldi, A1 - Wolfgang Ecker, A1 - Renate Henftling, A1 - Matthias Bauer, PY - 2004 VL - 21 JA - IEEE Design and Test of Computers ER -

Martin Zambaldi, Infineon Technologies

Wolfgang Ecker, Infineon Technologies

Renate Henftling, Infineon Technologies

Matthias Bauer, Infineon Technologies

Editor's note: This adaptive architecture for structuring testbenches accommodates various models of a design, from transaction to silicon. Moreover, the adapter-based architecture supports the execution of design models on different simulators (high level, RTL, gate level, and switch level), hardware emulators (the testbench runs entirely on the emulator), and even testers. —Carl Pixley, Synopsys

Citation:

Martin Zambaldi, Wolfgang Ecker, Renate Henftling, Matthias Bauer, "A Layered Adaptive Verification Platform for Simulation, Test, and Emulation," IEEE Design and Test of Computers, vol. 21, no. 6, pp. 464-471, Nov./Dec. 2004, doi:10.1109/MDT.2004.73

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