Scott Davidson,
"Testing: It's not just pass/fail anymore,"
IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, January/February, 2005.
BibTex
x
@article{
10.1109/MDT.2005.22, author = {Scott Davidson}, title = {Testing: It's not just pass/fail anymore}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {1}, issn = {0740-7475}, year = {2005}, pages = {80}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.22}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - MGZN JO - IEEE Design and Test of Computers TI - Testing: It's not just pass/fail anymore IS - 1 SN - 0740-7475 SP EP EPD - 80 A1 - Scott Davidson, PY - 2005 VL - 22 JA - IEEE Design and Test of Computers ER -
Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design and Test of Computers, vol. 22, no. 1, pp. 80, Jan./Feb. 2005, doi:10.1109/MDT.2005.22
PURCHASE ARTICLE: $19
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb