A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies

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http://doi.ieeecomputersociety.org/10.1109/MDT.2005.76

July/August 2005 (vol. 22 no. 4) pp. 316-326

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	ASCII Text	x
	Chen He, Margarida F. Jacome, Gustavo de Veciana, "A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 316-326, July/August, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.76, author = {Chen He and Margarida F. Jacome and Gustavo de Veciana}, title = {A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {4}, issn = {0740-7475}, year = {2005}, pages = {316-326}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.76}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies IS - 4 SN - 0740-7475 SP316 EP326 EPD - 316-326 A1 - Chen He, A1 - Margarida F. Jacome, A1 - Gustavo de Veciana, PY - 2005 KW - Nanotechnologies KW - probabilistic design KW - defect tolerance KW - reconfiguration VL - 22 JA - IEEE Design and Test of Computers ER -

Chen He, University of Texas at Austin and Freescale Semiconductor Inc.

Margarida F. Jacome, University of Texas at Austin

Gustavo de Veciana, University of Texas at Austin

To address the density, scalability, and reliability challenges of emerging nanotechnologies, the authors propose a hierarchy of design abstractions, constructed as reconfigurable fabric regions, whereby designers assign small functional flows to each region. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.

Index Terms:

Nanotechnologies, probabilistic design, defect tolerance, reconfiguration

Citation:

Chen He, Margarida F. Jacome, Gustavo de Veciana, "A Reconfiguration-Based Defect-Tolerant Design Paradigm for Nanotechnologies," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 316-326, July/Aug. 2005, doi:10.1109/MDT.2005.76

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