A Designer's Guide to Built-in Self-Test, by Charles E. Stroud (Springer, 2002, ISBN 1-402-07050-0, 344 pp., $125). BIST is conceptually very simple: You move test generation and the collection of test results onto the chip. If the logic is close to combinational, or the memory is testable with an algorithm that?s relatively easy to implement, you get good results and high fault coverage. But one of the strengths of this book is its attention to the traps that a BIST designer will run into. Topics discussed include fault models, simulation, detection, scan, boundary scan, counters, linear feedback shift registers, cellular automata, non-intrusive BIST architectures, and mixed-signal BIST.