Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/MDT.2005.93

July/August 2005 (vol. 22 no. 4) pp. 298-305

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Darshan D. Thaker Articles by Francois Impens Articles by Isaac L. Chuang Articles by Rajeevan Amirtharajah Articles by Frederic T. Chong

	ASCII Text	x
	Darshan D. Thaker, Francois Impens, Isaac L. Chuang, Rajeevan Amirtharajah, Frederic T. Chong, "Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 298-305, July/August, 2005.

	BibTex	x
	@article{ 10.1109/MDT.2005.93, author = {Darshan D. Thaker and Francois Impens and Isaac L. Chuang and Rajeevan Amirtharajah and Frederic T. Chong}, title = {Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era}, journal ={IEEE Design and Test of Computers}, volume = {22}, number = {4}, issn = {0740-7475}, year = {2005}, pages = {298-305}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.93}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era IS - 4 SN - 0740-7475 SP298 EP305 EPD - 298-305 A1 - Darshan D. Thaker, A1 - Francois Impens, A1 - Isaac L. Chuang, A1 - Rajeevan Amirtharajah, A1 - Frederic T. Chong, PY - 2005 KW - Redundant design KW - Error-checking KW - Emerging technologies KW - Fault tolerance VL - 22 JA - IEEE Design and Test of Computers ER -

Darshan D. Thaker, University of California, Davis

Francois Impens, Massachusetts Institute of Technology

Isaac L. Chuang, Massachusetts Institute of Technology

Rajeevan Amirtharajah, University of California, Davis

Frederic T. Chong, University of California, Santa Barbara

Although recursive voting leads to a double exponential decrease in a circuit's failure probability, a single error in the last majority gate can cause an incorrect result, hampering the technique's effectiveness. Combining recursive majority voting and multiplexing helps alleviate this problem. However, the cost of this fault-tolerant approach might not be worthwhile, depending on the nature of the faults.

Index Terms:

Redundant design, Error-checking, Emerging technologies, Fault tolerance

Citation:

Darshan D. Thaker, Francois Impens, Isaac L. Chuang, Rajeevan Amirtharajah, Frederic T. Chong, "Recursive TMR: Scaling Fault Tolerance in the Nanoscale Era," IEEE Design and Test of Computers, vol. 22, no. 4, pp. 298-305, July/Aug. 2005, doi:10.1109/MDT.2005.93

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.