This DFT methodology for testing switched-capacitor filters uses a parallel connection of structurally all-pass sections. It enables multiple fault detection and accurate estimation of actually implemented parameter values, while occupying a small area and using only simple adder circuits. Requiring no reconfiguration of the circuit under test, it is suitable for online testing.
Index Terms:
allpass circuits, analog integrated circuits, circuit testing, fault diagnosis, fault location, filters, switched-capacitor filters, testing
Citation:
Antonio Petraglia, Jorge M. Ca?ive, Mariane R. Petraglia, "Efficient Parametric Fault Detection in Switched-Capacitor Filters," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 58-66, Jan./Feb. 2006, doi:10.1109/MDT.2006.11