Improving Transition Delay Test Using a Hybrid Method

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http://doi.ieeecomputersociety.org/10.1109/MDT.2006.127

September/October 2006 (vol. 23 no. 5) pp. 402-412

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	Nisar Ahmed, Mohammad Tehranipoor, "Improving Transition Delay Test Using a Hybrid Method," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 402-412, September/October, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.127, author = {Nisar Ahmed and Mohammad Tehranipoor}, title = {Improving Transition Delay Test Using a Hybrid Method}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {5}, issn = {0740-7475}, year = {2006}, pages = {402-412}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.127}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Improving Transition Delay Test Using a Hybrid Method IS - 5 SN - 0740-7475 SP402 EP412 EPD - 402-412 A1 - Nisar Ahmed, A1 - Mohammad Tehranipoor, PY - 2006 KW - delay testing KW - launch-off-capture KW - test quality VL - 23 JA - IEEE Design and Test of Computers ER -

Nisar Ahmed, University of Connecticut

Mohammad Tehranipoor, University of Connecticut

Structured delay test using scan transition tests is becoming commonplace. But high coverage and compact tests can still be elusive in some situations. The authors propose a novel technique combining the cost-effectiveness of launch-from-capture test with the coverage/pattern volume advantages of launch-from-shift.

Index Terms:

delay testing, launch-off-capture, test quality

Citation:

Nisar Ahmed, Mohammad Tehranipoor, "Improving Transition Delay Test Using a Hybrid Method," IEEE Design and Test of Computers, vol. 23, no. 5, pp. 402-412, Sep./Oct. 2006, doi:10.1109/MDT.2006.127

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