New beginnings, continued success

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http://doi.ieeecomputersociety.org/10.1109/MDT.2006.21

January/February 2006 (vol. 23 no. 1) pp. 5-6

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	Kwang-Ting (Tim) Cheng, "New beginnings, continued success," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 5-6, January/February, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.21, author = {Kwang-Ting (Tim) Cheng}, title = {New beginnings, continued success}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {1}, issn = {0740-7475}, year = {2006}, pages = {5-6}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.21}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - New beginnings, continued success IS - 1 SN - 0740-7475 SP5 EP6 EPD - 5-6 A1 - Kwang-Ting (Tim) Cheng, PY - 2006 KW - design and test KW - heterogeneous systems KW - nanometer technology KW - design debugging KW - transistor mismatch KW - dependability analysis KW - jitter-tolerance testing KW - design for testability VL - 23 JA - IEEE Design and Test of Computers ER -

Kwang-Ting (Tim) Cheng

In his first EIC message as D&T's new editor in chief, Tim Cheng notes that D&T has developed strong relationships with key electronic-design and test communities over the past several years. Such partnerships help to broaden the readership and further strengthen D&T's position as the leading magazine for the professional design, test, and design automation communities.

Index Terms:

design and test, heterogeneous systems, nanometer technology, design debugging, transistor mismatch, dependability analysis, jitter-tolerance testing, design for testability

Citation:

Kwang-Ting (Tim) Cheng, "New beginnings, continued success," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 5-6, Jan./Feb. 2006, doi:10.1109/MDT.2006.21

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