loading...
TTTC Newsletter
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.25January/February 2006 (vol. 23 no. 1) pp. 76-77
 This Article 
 
PURCHASE ARTICLE: $0
Buy HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
"TTTC Newsletter," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 76-77, January/February, 2006.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2006.25,
author = {},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {1},
issn = {0740-7475},
year = {2006},
pages = {76-77},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.25},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 1
SN - 0740-7475
SP76
EP77
EPD - 76-77
PY - 2006
KW - TTTC
KW - test technology
KW - ITC 2005
KW - test technology educational program
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, ITC 2005, test technology educational program
Citation:
"TTTC Newsletter," IEEE Design and Test of Computers, vol. 23, no. 1, pp. 76-77, Jan./Feb. 2006, doi:10.1109/MDT.2006.25
Usage of this product signifies your acceptance of the Terms of Use.