Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/MDT.2006.41

March/April 2006 (vol. 23 no. 2) pp. 86-87

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Phil Nigh

	ASCII Text	x
	Phil Nigh, "Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 86-87, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.41, author = {Phil Nigh}, title = {Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {86-87}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.41}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects IS - 2 SN - 0740-7475 SP86 EP87 EPD - 86-87 A1 - Phil Nigh, PY - 2006 KW - latent defects KW - reliability defects KW - latent-defect screening KW - defect acceleration KW - burn-in KW - DPPM VL - 23 JA - IEEE Design and Test of Computers ER -

Phil Nigh, IBM Microelectronics

Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.

Index Terms:

latent defects, reliability defects, latent-defect screening, defect acceleration, burn-in, DPPM

Citation:

Phil Nigh, "Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 86-87, Mar./Apr. 2006, doi:10.1109/MDT.2006.41

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.