ITC 2005 panels

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March/April 2006 (vol. 23 no. 2) pp. 164-166

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	ASCII Text	x
	Carol Stolicny, "ITC 2005 panels," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 164-166, March/April, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.45, author = {Carol Stolicny}, title = {ITC 2005 panels}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {2}, issn = {0740-7475}, year = {2006}, pages = {164-166}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.45}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - ITC 2005 panels IS - 2 SN - 0740-7475 SP164 EP166 EPD - 164-166 A1 - Carol Stolicny, PY - 2006 KW - International Test Conference KW - ITC 2005 KW - multicore testing KW - design for testability KW - soft errors KW - test compression VL - 23 JA - IEEE Design and Test of Computers ER -

Summaries of panel sessions from the 2005 International Test Conference.

Index Terms:

International Test Conference, ITC 2005, multicore testing, design for testability, soft errors, test compression

Citation:

Carol Stolicny, "ITC 2005 panels," IEEE Design and Test of Computers, vol. 23, no. 2, pp. 164-166, Mar./Apr. 2006, doi:10.1109/MDT.2006.45

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