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2006 Latin American Test Workshop
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.58May/June 2006 (vol. 23 no. 3) pp. 185
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Fabian Vargas, "2006 Latin American Test Workshop," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 185, May/June, 2006.
 
 
BibTex
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@article{ 10.1109/MDT.2006.58,
author = {Fabian Vargas},
title = {2006 Latin American Test Workshop},
journal ={IEEE Design and Test of Computers},
volume = {23},
number = {3},
issn = {0740-7475},
year = {2006},
pages = {185},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.58},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - MGZN
JO - IEEE Design and Test of Computers
TI - 2006 Latin American Test Workshop
IS - 3
SN - 0740-7475
SP
EP
EPD - 185
A1 - Fabian Vargas,
PY - 2006
KW - Latin American Test Workshop
VL - 23
JA - IEEE Design and Test of Computers
ER -
 
Fabian Vargas, General Chair, LATW '06
The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW '06), held in the capital city of Buenos Aires, Argentina, 26-29 March.
Index Terms:
Latin American Test Workshop
Citation:
Fabian Vargas, "2006 Latin American Test Workshop," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 185, May/June 2006, doi:10.1109/MDT.2006.58
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