DAC Highlights

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http://doi.ieeecomputersociety.org/10.1109/MDT.2006.66

May/June 2006 (vol. 23 no. 3) pp. 182-184

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	Sachin Sapatnekar, Grant Martin, "DAC Highlights," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 182-184, May/June, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.66, author = {Sachin Sapatnekar and Grant Martin}, title = {DAC Highlights}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {3}, issn = {0740-7475}, year = {2006}, pages = {182-184}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.66}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - DAC Highlights IS - 3 SN - 0740-7475 SP182 EP184 EPD - 182-184 A1 - Sachin Sapatnekar, A1 - Grant Martin, PY - 2006 KW - Design Automation Conference KW - DAC VL - 23 JA - IEEE Design and Test of Computers ER -

Sachin Sapatnekar, University of Minnesota

Grant Martin, Tensilica

The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.

Index Terms:

Design Automation Conference, DAC

Citation:

Sachin Sapatnekar, Grant Martin, "DAC Highlights," IEEE Design and Test of Computers, vol. 23, no. 3, pp. 182-184, May/June 2006, doi:10.1109/MDT.2006.66

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