Conference Reports

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http://doi.ieeecomputersociety.org/10.1109/MDT.2006.91

July/August 2006 (vol. 23 no. 4) pp. 262-265

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	Similar Articles Articles by Mitra Subhasish Articles by Ondrej Novak Articles by Hana Kubatova Articles by Bashir M. Al-Hashimi Articles by Erik Jan Marinissen Articles by C.P. Ravikumar

	ASCII Text	x
	Mitra Subhasish, Ondrej Novak, Hana Kubatova, Bashir M. Al-Hashimi, Erik Jan Marinissen, C.P. Ravikumar, "Conference Reports," IEEE Design and Test of Computers, vol. 23, no. 4, pp. 262-265, July/August, 2006.

	BibTex	x
	@article{ 10.1109/MDT.2006.91, author = {Mitra Subhasish and Ondrej Novak and Hana Kubatova and Bashir M. Al-Hashimi and Erik Jan Marinissen and C.P. Ravikumar}, title = {Conference Reports}, journal ={IEEE Design and Test of Computers}, volume = {23}, number = {4}, issn = {0740-7475}, year = {2006}, pages = {262-265}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.91}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Conference Reports IS - 4 SN - 0740-7475 SP262 EP265 EPD - 262-265 A1 - Mitra Subhasish, A1 - Ondrej Novak, A1 - Hana Kubatova, A1 - Bashir M. Al-Hashimi, A1 - Erik Jan Marinissen, A1 - C.P. Ravikumar, PY - 2006 KW - Logic Soft Errors KW - conference report VL - 23 JA - IEEE Design and Test of Computers ER -

Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).

Index Terms:

Logic Soft Errors, conference report

Citation:

Mitra Subhasish, Ondrej Novak, Hana Kubatova, Bashir M. Al-Hashimi, Erik Jan Marinissen, C.P. Ravikumar, "Conference Reports," IEEE Design and Test of Computers, vol. 23, no. 4, pp. 262-265, July/Aug. 2006, doi:10.1109/MDT.2006.91

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