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TTTC Newsletter
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.29January-February 2007 (vol. 24 no. 1) pp. 97
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Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 1, pp. 97, January-February, 2007.
 
 
BibTex
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@article{ 10.1109/MDT.2007.29,
author = {Bruce C. Kim},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {24},
number = {1},
issn = {0740-7475},
year = {2007},
pages = {97},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.29},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 1
SN - 0740-7475
SP
EP
EPD - 97
A1 - Bruce C. Kim,
PY - 2007
KW - TTTC
KW - test technology
KW - MSE 07
KW - SWTW 07
KW - IMSTW 07
VL - 24
JA - IEEE Design and Test of Computers
ER -
 
Bruce C. Kim, University of Alabama
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, MSE 07, SWTW 07, IMSTW 07
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 24, no. 1, pp. 97, Jan. 2007, doi:10.1109/MDT.2007.29
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