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TTTC Newsletter
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.28January-February 2008 (vol. 25 no. 1) pp. 103
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Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 1, pp. 103, January-February, 2008.
 
 
BibTex
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@article{ 10.1109/MDT.2008.28,
author = {Bruce C. Kim},
title = {TTTC Newsletter},
journal ={IEEE Design and Test of Computers},
volume = {25},
number = {1},
issn = {0740-7475},
year = {2008},
pages = {103},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.28},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - TTTC Newsletter
IS - 1
SN - 0740-7475
SP
EP
EPD - 103
A1 - Bruce C. Kim,
PY - 2008
KW - TTTC
KW - test technology
KW - DATE
KW - DDECS
KW - VTS
KW - WTW
KW - ETS
KW - SDD
VL - 25
JA - IEEE Design and Test of Computers
ER -
 
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
TTTC, test technology, DATE, DDECS, VTS, WTW, ETS, SDD
Citation:
Bruce C. Kim, "TTTC Newsletter," IEEE Design and Test of Computers, vol. 25, no. 1, pp. 103, Jan. 2008, doi:10.1109/MDT.2008.28
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