loading...
The commonality of vector generation techniques
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.53March-April 2008 (vol. 25 no. 2) pp. 200
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
Scott Davidson, "The commonality of vector generation techniques," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 200, March-April, 2008.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2008.53,
author = {Scott Davidson},
title = {The commonality of vector generation techniques},
journal ={IEEE Design and Test of Computers},
volume = {25},
number = {2},
issn = {0740-7475},
year = {2008},
pages = {200},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2008.53},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - The commonality of vector generation techniques
IS - 2
SN - 0740-7475
SP
EP
EPD - 200
A1 - Scott Davidson,
PY - 2008
KW - vector generation
KW - test compression
KW - full scan
KW - ATPG
KW - logic BIST
KW - output compression
KW - non-fault-directed test
KW - semi-fault-directed test
VL - 25
JA - IEEE Design and Test of Computers
ER -
 
Scott Davidson, Sun Microsystems
The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.
Index Terms:
vector generation, test compression, full scan, ATPG, logic BIST, output compression, non-fault-directed test, semi-fault-directed test
Citation:
Scott Davidson, "The commonality of vector generation techniques," IEEE Design and Test of Computers, vol. 25, no. 2, pp. 200, Mar. 2008, doi:10.1109/MDT.2008.53
Usage of this product signifies your acceptance of the Terms of Use.