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FreePDK: An Open-Source Variation-Aware Design Kit
San Diego, CA June 03-June 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MSE.2007.442007 IEEE International Conference on ...
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James E. Stine, Ivan Castellanos, Michael Wood, Jeff Henson, Fred Love, W. Rhett Davis, Paul D. Franzon, Michael Bucher, Sunil Basavarajaiah, Julie Oh, Ravi Jenkal, "FreePDK: An Open-Source Variation-Aware Design Kit," Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on, pp. 173-174, 2007 IEEE International Conference on Microelectronic Systems Education (MSE'07), 2007.
 
 
BibTex
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@article{ 10.1109/MSE.2007.44,
author = {James E. Stine and Ivan Castellanos and Michael Wood and Jeff Henson and Fred Love and W. Rhett Davis and Paul D. Franzon and Michael Bucher and Sunil Basavarajaiah and Julie Oh and Ravi Jenkal},
title = {FreePDK: An Open-Source Variation-Aware Design Kit},
journal ={Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on},
volume = {0},
year = {2007},
isbn = {0-7695-2849-X},
pages = {173-174},
doi = {http://doi.ieeecomputersociety.org/10.1109/MSE.2007.44},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on
TI - FreePDK: An Open-Source Variation-Aware Design Kit
SN - 0-7695-2849-X
SP173
EP174
A1 - James E. Stine,
A1 - Ivan Castellanos,
A1 - Michael Wood,
A1 - Jeff Henson,
A1 - Fred Love,
A1 - W. Rhett Davis,
A1 - Paul D. Franzon,
A1 - Michael Bucher,
A1 - Sunil Basavarajaiah,
A1 - Julie Oh,
A1 - Ravi Jenkal,
PY - 2007
KW - null
VL - 0
JA - Microelectronics Systems Education, IEEE International Conference on/Multimedia Software Engineering, International Symposium on
ER -
 
James E. Stine, Oklahoma State University, USA
Ivan Castellanos, Oklahoma State University, USA
Michael Wood, Oklahoma State University, USA
Jeff Henson, Oklahoma State University, USA
Fred Love, Oklahoma State University, USA
W. Rhett Davis, North Carolina State University, USA
Paul D. Franzon, North Carolina State University, USA
Michael Bucher, North Carolina State University, USA
Sunil Basavarajaiah, North Carolina State University, USA
Julie Oh, North Carolina State University, USA
Ravi Jenkal, North Carolina State University, USA
This paper discusses an open source, variation aware Process Design Kit (PDK), based on Scalable CMOS design rules, down to 45nm, for use in VLSI research, education and small businesses. This kit includes all the necessary layout design rules and extraction command decks to capture layout dependent systematic variation and perform statistical circuit analysis. The kit also includes a standard cell and pad library with the necessary support files to enable full chip place and route and verification for System on Chip designs. Test chips designed with this PDK are designed in such a way so that they can be fabricated by fabrication facilities allowing validation of the design rules so that the rules may be used in future multi-project runs and design contests.
Citation:
James E. Stine, Ivan Castellanos, Michael Wood, Jeff Henson, Fred Love, W. Rhett Davis, Paul D. Franzon, Michael Bucher, Sunil Basavarajaiah, Julie Oh, Ravi Jenkal, "FreePDK: An Open-Source Variation-Aware Design Kit," mse, pp.173-174, 2007 IEEE International Conference on Microelectronic Systems Education (MSE'07), 2007
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