Rob Aitken,
"Redundancy & It?s Not Just for Defects Anymore,"
Memory Technology, Design and Testin, IEEE International Workshop on, pp. 117-120, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004.
BibTex
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@article{
10.1109/MTDT.2004.19, author = {Rob Aitken}, title = {Redundancy & It?s Not Just for Defects Anymore}, journal ={Memory Technology, Design and Testin, IEEE International Workshop on}, volume = {0}, year = {2004}, issn = {1087-4852}, pages = {117-120}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.19}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Memory Technology, Design and Testin, IEEE International Workshop on TI - Redundancy & It?s Not Just for Defects Anymore SN - 1087-4852 SP117 EP120 A1 - Rob Aitken, PY - 2004 KW - null VL - 0 JA - Memory Technology, Design and Testin, IEEE International Workshop on ER -
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
Citation:
Rob Aitken, "Redundancy & It?s Not Just for Defects Anymore," mtdt, pp.117-120, Records of the 2004 International Workshop on Memory Technology, Design and Testing (MTDT'04), 2004
PURCHASE ARTICLE: $19
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