MRAM Write Error Categorization with QCKB

Taipei, Taiwan August 02-August 04

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.19

2006 IEEE International Workshop on M ...

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Yuui Shimizu Articles by Hisanori Aikawa Articles by Keiji Hosotani Articles by Naoharu Shimomura Articles by Tadashi Kai Articles by Yoshihiro Articles by Yoshiaki Asao Articles by Yoshihisa Iwata Articles by Kenji Tsuchida Articles by Sumio Ikegawa

	ASCII Text	x
	Yuui Shimizu, Hisanori Aikawa, Keiji Hosotani, Naoharu Shimomura, Tadashi Kai, Yoshihiro , Yoshiaki Asao, Yoshihisa Iwata, Kenji Tsuchida, Sumio Ikegawa, "MRAM Write Error Categorization with QCKB," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 43-48, 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06), 2006.

	BibTex	x
	@article{ 10.1109/MTDT.2006.19, author = {Yuui Shimizu and Hisanori Aikawa and Keiji Hosotani and Naoharu Shimomura and Tadashi Kai and Yoshihiro and Yoshiaki Asao and Yoshihisa Iwata and Kenji Tsuchida and Sumio Ikegawa}, title = {MRAM Write Error Categorization with QCKB}, journal ={Memory Technology, Design and Testin, IEEE International Workshop on}, volume = {0}, year = {2006}, issn = {1087-4852}, pages = {43-48}, doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.19}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Memory Technology, Design and Testin, IEEE International Workshop on TI - MRAM Write Error Categorization with QCKB SN - 1087-4852 SP43 EP48 A1 - Yuui Shimizu, A1 - Hisanori Aikawa, A1 - Keiji Hosotani, A1 - Naoharu Shimomura, A1 - Tadashi Kai, A1 - Yoshihiro , A1 - Yoshiaki Asao, A1 - Yoshihisa Iwata, A1 - Kenji Tsuchida, A1 - Sumio Ikegawa, PY - 2006 KW - null VL - 0 JA - Memory Technology, Design and Testin, IEEE International Workshop on ER -

Yuui Shimizu, Toshiba Corporation, Japan

Hisanori Aikawa, Toshiba Corporation, Japan

Keiji Hosotani, Toshiba Corporation, Japan

Naoharu Shimomura, Toshiba Corporation, Japan

Tadashi Kai, Toshiba Corporation, Japan

Yoshihiro, Toshiba Corporation, Japan

Yoshiaki Asao, Toshiba Corporation, Japan

Yoshihisa Iwata, Toshiba Corporation, Japan

Kenji Tsuchida, Toshiba Corporation, Japan

Sumio Ikegawa, Toshiba Corporation, Japan

A new test pattern, Quadruplet Checker Board (QCKBD), is proposed which enables to evaluate magnetic crosstalk from the neighbor write lines. At Jirst, some conventional test patterns changing the write points were applied to categorize Magnetic Random Access Memory (MRAM) write errors. But magnetic crosstalk from the neighbor write lines could not be isolated by these conventional tests since magnetic crosstalk error was caused when the neighbor cell is written. Whereas the QCKBD results from 4Kb test vehicles show that magnetic crosstalk restricts the write margin. By changing the cell structure in order to suppress magnetic crosstalk, the write margin is improved from 3.3 to 7.3.

Citation:

Yuui Shimizu, Hisanori Aikawa, Keiji Hosotani, Naoharu Shimomura, Tadashi Kai, Yoshihiro , Yoshiaki Asao, Yoshihisa Iwata, Kenji Tsuchida, Sumio Ikegawa, "MRAM Write Error Categorization with QCKB," mtdt, pp.43-48, 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06), 2006

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.