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Identification of Gates for Covering all Critical Paths
Austin, Texas September 09-September 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTV.2004.15Fifth International Workshop on Micro ...
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M. Moiz Khan, Spyros Tragoudas, Magdy Abadir, Brandon Liu, "Identification of Gates for Covering all Critical Paths," Microprocessor Test and Verification, International Workshop on, pp. 92-96, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004.
 
 
BibTex
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@article{ 10.1109/MTV.2004.15,
author = {M. Moiz Khan and Spyros Tragoudas and Magdy Abadir and Brandon Liu},
title = {Identification of Gates for Covering all Critical Paths},
journal ={Microprocessor Test and Verification, International Workshop on},
volume = {0},
year = {2004},
issn = {1550-4093},
pages = {92-96},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTV.2004.15},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Microprocessor Test and Verification, International Workshop on
TI - Identification of Gates for Covering all Critical Paths
SN - 1550-4093
SP92
EP96
A1 - M. Moiz Khan,
A1 - Spyros Tragoudas,
A1 - Magdy Abadir,
A1 - Brandon Liu,
PY - 2004
KW - null
VL - 0
JA - Microprocessor Test and Verification, International Workshop on
ER -
 
M. Moiz Khan, Southern Illinois University
Spyros Tragoudas, Southern Illinois University
Magdy Abadir, Freescale Semiconductor Inc.
Brandon Liu, Freescale Semiconductor Inc.
A Zero-Suppressed Binary Decision Diagram (ZBDD) based method is presented to identify a small set of gates so that every critical path contains at least one of the selected gates. All paths above a threshold Dth are stored in a ZBDD. Static implications are used to eliminate unsensitizable paths. A min-cut method on the ZBDD is then used to identify a small set of gates in the circuit for buffer insertion or resizing to optimize delay of the whole circuit. It is observed that the methodology identifies a very small set of gates and its effectiveness demonstrated experimentally on ISCAS?85 and ITC?99 benchmarks.
Citation:
M. Moiz Khan, Spyros Tragoudas, Magdy Abadir, Brandon Liu, "Identification of Gates for Covering all Critical Paths," mtv, pp.92-96, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004
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