Real world requirements such as low-power modes of operation and multiple clock domains often necessitate gate-level System-on-Chip (SoC) verification environments. Additional complexities introduced by tester compliance impose restrictions on the control and repeatability of simulations over all situations, including register-transfer-level (RTL) and different gate-level conditions. Making full use of the Vera high-level verification language in these circumstances requires special considerations and techniques not normally applied in a module-level RTL testbench. If the intent is to reuse Vera monitors, drivers and result-checkers in the gate-level SoC environment then the code must be designed appropriately. This paper first explores the generic issues of interacting with a gate-level SoC in a tester compliant manner and then proceeds to derive Vera coding guidelines that ensure robust operation across a range of testbench abstractions from module-level RTL through to tester-compliant gate-level SoC implementations.
Citation:
Mark Litterick, Joachim Geishauser, "Robust Vera Coding Techniques for Gate-Level and Tester-Compliant SoC Verification Environments," mtv, pp.64-78, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004