loading...
Automatic Test Programs Generation Driven by Internal Performance Counters
Austin, Texas September 09-September 10
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTV.2004.5Fifth International Workshop on Micro ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
W. Lindsay, Intel® Corporation
E. Sanchez, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
G. Squillero, Politecnico di Torino
In the past performance counters have been available to top-end microprocessors as hardware luxuries for profiling critical applications. Today, on the contrary, several desktop microprocessors contain hardware support for monitoring performance events. This paper proposes a new approach to automatic test program generation that exploits such hardware to monitor specific micro-architectural events. In the approach, the generation tool repeatedly evaluates and improves candidate programs directly running on the target microprocessor: candidate programs are not "simulated", but rather "executed". The fast evaluation of candidate tests enables the use of an automatic methodology even on large designs. As a case study, an experiment targeting the Intel? Pentium? 4 microprocessor is reported.
Citation:
W. Lindsay, E. Sanchez, M. Sonza Reorda, G. Squillero, "Automatic Test Programs Generation Driven by Internal Performance Counters," mtv, pp.8-13, Fifth International Workshop on Microprocessor Test and Verification (MTV'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.