loading...
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Austin, Texas November 03-November 05
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTV.2005.11Sixth International Workshop on Micro ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
P. Bernardi, Politecnico di Torino, Italy
M. Grosso, Politecnico di Torino, Italy
M. Rebaudengo, Politecnico di Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Italy
Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor Software-Based Self Test (SBST).
Citation:
P. Bernardi, M. Grosso, M. Rebaudengo, M. Sonza Reorda, "Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores," mtv, pp.55-62, Sixth International Workshop on Microprocessor Test and Verification (MTV'05), 2005
Usage of this product signifies your acceptance of the Terms of Use.