Testing chips is very critical to guarantee chips are fault-free before they are integrated in a system, so as to increase the reliability of the system. Although fullscan is a widely adopted design-for-test technique for LSI design and testing, the need for reducing the test data Volume, scan-in Power dissipation and test application Time (VPT) of the full-scan designed chip is imperative. Based on the analysis of the characteristics of the variable-to-fixed run-length coding technique and the random access scan architecture, this paper presents a novel design scheme tackling all VPT issues simultaneously. Experimental results on ISCAS?89 benchmarks have shown on average 51.2%, 99.5%, 99.3% and 85.5% reduction in test data volume, average scan-in power dissipation, peak scan-in power dissipation and test application time, respectively.