loading...
White Box Pairwise Test Case Generation
Portland, Oregon, USA October 11-October 12
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/QSIC.2007.71Seventh International Conference on Q ...
 This Article 
 
PDF
HTML
IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Jangbok Kim, Ajou University, Suwon, Korea
Kyunghee Choi, Ajou University, Suwon, Korea
Daniel M. Hoffman, University of Victoria, Victoria, BC, Canada
Gihyun Jung, Ajou University, Suwon, Korea
Pairwise testing is an intuitive approach to test case generation, and has already seen use in commercial tools and practical applications. Pairwise testing is black box, in the sense that the test selection is independent of the internal structure of the system. We present a white box extension which selects additional test cases for the system based on specifications for one or more internal sub- operations. We have developed a novel algorithm for generating test cases for the full system which achieve pairwise coverage of the sub-operations. We have evaluated the algorithm using a case study, which indicates the practicality and effectiveness of the approach.
Citation:
Jangbok Kim, Kyunghee Choi, Daniel M. Hoffman, Gihyun Jung, "White Box Pairwise Test Case Generation," qsic, pp.286-291, Seventh International Conference on Quality Software (QSIC 2007), 2007
Usage of this product signifies your acceptance of the Terms of Use.