"Call for Participation: 10th IEEE VLSI Design & Test Symposium,"
VLSI Design, International Conference on, pp. xli, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006.
BibTex
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@article{
10.1109/VLSID.2006.55, author = {}, title = {Call for Participation: 10th IEEE VLSI Design & Test Symposium}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2006}, issn = {1063-9667}, pages = {xli}, doi = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.55}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Design, International Conference on TI - Call for Participation: 10th IEEE VLSI Design & Test Symposium SN - 1063-9667 SP EP PY - 2006 KW - null VL - 0 JA - VLSI Design, International Conference on ER -
Citation:
"Call for Participation: 10th IEEE VLSI Design & Test Symposium," vlsid, pp.xli, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), 2006
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