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Low-Cost On-Line Test for Digital Filters
San Diego, California April 26-April 30
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1999.7667021999 17TH IEEE VLSI Test Symposium
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Ismet Bayraktaroglu, Alex Orailoglu, "Low-Cost On-Line Test for Digital Filters," VLSI Test Symposium, IEEE, pp. 446, 1999 17TH IEEE VLSI Test Symposium, 1999.
 
 
BibTex
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@article{ 10.1109/VTEST.1999.766702,
author = {Ismet Bayraktaroglu and Alex Orailoglu},
title = {Low-Cost On-Line Test for Digital Filters},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1999},
issn = {1093-0167},
pages = {446},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1999.766702},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Low-Cost On-Line Test for Digital Filters
SN - 1093-0167
SP
EP
A1 - Ismet Bayraktaroglu,
A1 - Alex Orailoglu,
PY - 1999
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Ismet Bayraktaroglu, University of California at San Diego
Alex Orailoglu, University of California at San Diego
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect possible malfunctioning of the circuit. The analysis performed indicates that 100% fault secureness is possible, if certain design constraints are followed.
Citation:
Ismet Bayraktaroglu, Alex Orailoglu, "Low-Cost On-Line Test for Digital Filters," vts, pp.446, 1999 17TH IEEE VLSI Test Symposium, 1999
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