loading...
On-Chip Spectrum Analyzer for Analog Built-In Self Test
Palm Springs, California May 01-May 05
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2005.6323rd IEEE VLSI Test Symposium (VTS'05)
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Anup P. Jose, Columbia University
Keith A. Jenkins, IBM T.J. Watson Research Center
Scott K. Reynolds, IBM T.J. Watson Research Center
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in conventional stand-alone instruments on a chip. Specifically, it makes use of a very-low IF architecture, which leads to a highly compact design, that can be used for measuring the frequency content of high frequency on-chip signals. The architecture and design considerations along with an implementation in a 0.18 ?m CMOS process is described. The design takes up an area of approximately 0.384 mm^2 with a simulated frequency range of 33 MHz to 3 GHz and a dynamic range of 60 dB.
Citation:
Anup P. Jose, Keith A. Jenkins, Scott K. Reynolds, "On-Chip Spectrum Analyzer for Analog Built-In Self Test," vts, pp.131-136, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
Usage of this product signifies your acceptance of the Terms of Use.