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Reviewers
Palm Springs, California May 01-May 05
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2005.7323rd IEEE VLSI Test Symposium (VTS'05)
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ASCII Text
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"Reviewers," VLSI Test Symposium, IEEE, pp. xvi-xvii, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
 
 
BibTex
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@article{ 10.1109/VTS.2005.73,
author = {},
title = {Reviewers},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {xvi-xvii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.73},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Reviewers
SN - 1093-0167
SPxvi
EPxvii
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Reviewers," vts, pp.xvi-xvii, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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