"Test Technology Educational Program: Overview of Tutorials,"
VLSI Test Symposium, IEEE, pp. xxii-xxv, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
BibTex
x
@article{
10.1109/VTS.2005.83, author = {}, title = {Test Technology Educational Program: Overview of Tutorials}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {xxii-xxv}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.83}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Educational Program: Overview of Tutorials SN - 1093-0167 SPxxii EPxxv PY - 2005 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"Test Technology Educational Program: Overview of Tutorials," vts, pp.xxii-xxv, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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