"Test Technology Technical Council,"
VLSI Test Symposium, IEEE, pp. xix-xxi, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
BibTex
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@article{
10.1109/VTS.2005.84, author = {}, title = {Test Technology Technical Council}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {xix-xxi}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.84}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Technical Council SN - 1093-0167 SPxix EPxxi PY - 2005 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
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