"VTS 2004 Best Innovative Practices Session Award,"
VLSI Test Symposium, IEEE, pp. 5, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
BibTex
x
@article{
10.1109/VTS.2005.89, author = {}, title = {VTS 2004 Best Innovative Practices Session Award}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {5}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.89}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - VTS 2004 Best Innovative Practices Session Award SN - 1093-0167 SP EP PY - 2005 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"VTS 2004 Best Innovative Practices Session Award," vts, pp.5, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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