"Organizing Committee,"
VLSI Test Symposium, IEEE, pp. xiii-xv, 24th IEEE VLSI Test Symposium, 2006.
BibTex
x
@article{
10.1109/VTS.2006.52, author = {}, title = {Organizing Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {xiii-xv}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.52}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - Organizing Committee SN - 0-7695-2514-8 SPxiii EPxv PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"Organizing Committee," vts, pp.xiii-xv, 24th IEEE VLSI Test Symposium, 2006
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