"Program Committee,"
VLSI Test Symposium, IEEE, pp. xvii, 24th IEEE VLSI Test Symposium, 2006.
BibTex
x
@article{
10.1109/VTS.2006.57, author = {}, title = {Program Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {xvii}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.57}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - Program Committee SN - 0-7695-2514-8 SP EP PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"Program Committee," vts, pp.xvii, 24th IEEE VLSI Test Symposium, 2006
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