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Session Abstract
Berkeley, California April 30-May 04
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.6624th IEEE VLSI Test Symposium
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Kee Sup Kim, Mohammad Tehranipoor, "Session Abstract," VLSI Test Symposium, IEEE, pp. 292-293, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.66,
author = {Kee Sup Kim and Mohammad Tehranipoor},
title = {Session Abstract},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {292-293},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.66},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Session Abstract
SN - 0-7695-2514-8
SP292
EP293
A1 - Kee Sup Kim,
A1 - Mohammad Tehranipoor,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
In the course of practicing DFT and test engineering, we make a number of engineering decisions since full set of data are not available. In academia, researchers search for the next big problem and struggle to get access to the real data. What are these missing data and what effects would they have if they were known?
Citation:
Kee Sup Kim, Mohammad Tehranipoor, "Session Abstract," vts, pp.292-293, 24th IEEE VLSI Test Symposium, 2006
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